Faculty Profiles

Miyahara, Y., Kim, D. S., Xiao, C., Dominguez, R. C., Lee, K., Mayorga-Luna, R., … Li, X. (2025). Moiré ferroelectricity modulates light emission from a semiconductor monolayer. Science Advances, 11(19), eaddt7789. Retrieved from https://www.science.org/doi/full/10.1126/sciadv.adt7789

Austin-Bingamon, N. L., D.C., B., & Miyahara, Y. (2024). Control of quality factor of atomic force microscopy cantilever by optomechanical effects. The Japanese Journal of Applied Physics, 63(4), 04SP84. https://doi.org/10.35848/1347-4065/ad39f6

Bustamante, J., Miyahara, Y., Fairgrieve-Park, L., Spruce, K., See, P., Curson, N., … Grutter, P. (2024). Needle in a haystack: Efficiently finding atomically defined quantum dots for electrostatic force microscopy. Review of Scientific Instruments, 95(8), 083709. https://doi.org/10.1063/5.0208571

Kim, D. S., Dominguez, R. C., Ye, D., Tan, T., Yao, W., Yang, L., … Li, X. (2024). Moiré excitons confined by twisted hBN substrates. In CLEO 2024, Technical Digest Series (Vol. 17, p. FW4B.3). Optica Publishing Group. https://doi.org/10.1364/cleo_fs.2024.fw4b.3

Khakurel, N. J., Amyx, D., Miyahara, Y., Chen, Y., & Geerts, W. J. (2024). Slot-die Coating of Famamidinium-Cesium mixed Halide Perovskites in Ambient conditions with FAAc additive. MRS Communications, 14, 215–221.

Kim, D. S., Dominguez, R. C., Mayorga-Luna, R., Ye, D., Embley, J., Tan, T., … Miyahara, Y. (2023). Electrostatic  moiré potential from twisted hexagonal boron nitride layers. Nature Materials, 23(1), 65–70. https://doi.org/10.1038/s41563-023-01637-7

Schumacher, Z., Rejali, R., Cowie, M., Spielhofer, A., Miyahara, Y., & Grutter, P. (2021). Charge carrier inversion in a doped thin film organic semiconductor island. ACS Nano, 15(6), 10377. https://doi.org/10.1021/acsnano.1c02600

Schumacher, Z., Rejali, R., Pachlatko, R., Spielhofer, A., Nagler, P., Miyahara, Y., … Grutter, Peter. (2020). Nanoscale Force Sensing of an Ultrafast Nonlinear Optical Response. Proceedings of the National Academy of Sciences of the United States of America, 117(33), 19773. https://doi.org/10/ghdqg8

Miyahara, Y., Griffin, H., Roy-Gobeil, A., Belyansky, R., Bergeron, H., Bustamante, Jos\’e, & Grutter, P. (2020). Optical excitation of atomic force microscopy cantilever for accurate spectroscopic measurements. EPJ Techniques and Instrumentation, 7(1), 2. https://doi.org/10.1140/epjti/s40485-020-0053-9

Roy-Gobeil, A., Miyahara, Y., Bevan, K. H., & Grutter, P. (2019). Fully Quantized Electron Transfer Observed in a Single Redox Molecule at a Metal Interface. Nano Letters, 19(9), 6104–6108. https://doi.org/10.1021/acs.nanolett.9b02032

Zhang, Y., Miyahara, Y., Derriche, N., Yang, W., Yazda, K., Capaldi, X., … Reisner, W. (2019). Nanopore Formation via Tip‐Controlled Local Breakdown Using an Atomic Force Microscope. Small Methods, 3(7), 1900147. https://doi.org/10.1002/smtd.201900147

St-Denis, T., Yazda, K., Capaldi, X., Bustamante, J., Safari, M., Miyahara, Y., … Reisner, W. (2019). An apparatus based on an atomic force microscope for implementing tip-controlled local breakdown. Review of Scientific Instruments, 90(12), 123703. https://doi.org/10.1063/1.5129665

Dagdeviren, O. E., Miyahara, Y., Mascaro, A., Enright, T., & Grütter, P. (2019). Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy. Sensors, 19(20), 4510. https://doi.org/10.3390/s19204510

Mascaro, A., Miyahara, Y., Enright, T., Dagdeviren, O. E., & Grutter, Peter. (2019). Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements. Beilstein Journal of Nanotechnology, 10, 617–633. https://doi.org/10.3762/bjnano.10.62

Dagdeviren, O. E., Miyahara, Y., Mascaro, A., & Grütter, P. (2019). Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensors. Review of Scientific Instruments, 90(1), 013703. https://doi.org/10.1063/1.5061831

Miyahara, Y., & Grutter, P. (2018). Dissipation modulated Kelvin probe force microscopy method. In Kelvin Probe Force Microsc. From Single Charg. Detect. to Device Charact. (Vol. 48, pp. 23--47). Berlin, Heidelberg: Springer International Publishing AG. https://doi.org/10.1007/978-3-319-75687-5_2

Mascaro, A., Miyahara, Y., Dagdeviren, O. E., & Grütter, P. (2018). Eliminating the effect of acoustic noise on cantilever spring constant calibration. Applied Physics Letters, 113(23), 233105. https://doi.org/10.1063/1.5063992

Miyahara, Y. (2018). Energy Level Spectroscopy of Individual Quantum Dots by Electric Force Detection with Atomic force Microscopy. Vac. Surf. Sci., 61(10), 645--650. https://doi.org/10.1380/vss.61.645

Bevan, K. H., Roy-Gobeil, A., Miyahara, Y., & Grutter, P. (2018). Relating Franck-Condon blockade to redox chemistry in the single-particle picture. The Journal of Chemical Physics, 149(10), 104109. https://doi.org/10.1063/1.5043480

Ganguly, M., Dib, S., Kurien, U., Rangel-Alvarado, R. B., Miyahara, Y., & Ariya, P. A. (2018). Influence of Environmentally Relevant Physicochemical Conditions on a Highly Efficient Inorganic Ice Nucleating Particle. The Journal of Physical Chemistry C, 122(32), 18690–18704. https://doi.org/10.1021/acs.jpcc.8b03551

Enright, T., Miyahara, Y., Mascaro, A., Aiken, C., & Grutter, P. (2018). Design of Combined Scanning Ion Conductance and Atomic Force Microscope for Investigation of Lithium Iron Phosphate. ECS Meeting Abstracts, MA2018-01(36), 2158–2158. https://doi.org/10.1149/ma2018-01/36/2158

Miyahara, Y., Roy-Gobeil, A., & Grutter, P. (2017). Quantum state readout of individual quantum dots by electrostatic force detection. Nanotechnology, 28(6), 064001. https://doi.org/10.1088/1361-6528/aa5261

Schumacher, Z., Spielhofer, A., Miyahara, Y., & Grutter, P. (2017). The limit of time resolution in frequency modulation atomic force microscopy by a pump-probe approach. Applied Physics Letters, 110(5), 053111. https://doi.org/10.1063/1.4975629

Mascaro, A., Wang, Z., Hovington, P., Miyahara, Y., Paolella, A., Gariepy, V., … Grutter, P. (2017). Measuring Spatially Resolved Collective Ionic Transport on Lithium Battery Cathodes Using Atomic Force Microscopy. Nano Letters, 17(7), 4489–4496. https://doi.org/10.1021/acs.nanolett.7b01857

Miyahara, Y., & Grutter, P. (2017). Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation. Applied Physics Letters, 110(16), 163103. https://doi.org/10.1063/1.4981937

Schumacher, Z., Miyahara, Y., Spielhofer, A., & Grutter, P. (2016). Measurement of Surface Photovoltage by Atomic Force Microscopy under Pulsed Illumination. Phys. Rev. Appl., 5(4), 044018. https://doi.org/10.1103/PhysRevApplied.5.044018

Magdesian, M. H., Lopez-Ayon, G. M., Mori, M., Boudreau, D., Goulet-Hanssens, A., Sanz, R., … Grutter, P. (2016). Rapid Mechanically Controlled Rewiring of Neuronal Circuits. The Journal of Neuroscience, 36(3), 979–987. https://doi.org/10.1523/JNEUROSCI.1667-15.2016

Miyahara, Y., Topple, J., Schumacher, Z., & Grutter, P. (2015). Kelvin Probe Force Microscopy by Dissipative Electrostatic Force Modulation. Physical Review Applied, 4(5), 054011. https://doi.org/10.1103/physrevapplied.4.054011

Schumacher, Z., Miyahara, Y., Aeschimann, L., & Gr\"utter, Peter. (2015). Improved atomic force microscopy cantilever performance by partial reflective coating. Beilstein J. Nanotechnol., 6, 1450--1456. https://doi.org/10.3762/bjnano.6.150

Roy-Gobeil, A., Miyahara, Y., & Grutter, P. (2015). Revealing Energy Level Structure of Individual Quantum Dots by Tunneling Rate Measured by Single-Electron Sensitive Electrostatic Force Spectroscopy. Nano Lett., 15(4), 2324--2328. https://doi.org/10.1021/nl504468a

Haidary, A., Miyahara, Y., & Gr\"utter, P. (2014). Antenna and Plasmonic Properties of Scanning Probe Tips at Optical and Terahertz Regimes, 1--6.

Zhou, X., Hedberg, J., Miyahara, Y., Grutter, P., & Ishibashi, K. (2014). Scanning gate imaging of two coupled quantum dots in single-walled carbon nanotubes. Nanotechnology, 25(49), 495703. https://doi.org/10.1088/0957-4484/25/49/495703

Paul, W., Oliver, D., Miyahara, Y., & Gr\"utter, Peter. (2014). FIM tips in SPM: Apex orientation and temperature considerations on atom transfer and diffusion. Applied Surface Science, 305, 124–132. https://doi.org/10.1016/j.apsusc.2014.03.002

Oliver, D. J., Paul, W., El Ouali, M., Hagedorn, T., Miyahara, Y., Qi, Y., & Gr\"utter, P H. (2014). One-to-one spatially matched experiment and atomistic simulations of nanometre-scale indentation. Nanotechnology, 25(2), 025701. https://doi.org/10.1088/0957-4484/25/2/025701

Paul, W., Oliver, D., Miyahara, Y., & Gr\"utter, Peter. (2013). FIM tips in SPM: Apex orientation and temperature considerations on atom transfer and diffusion. arXiv Prepr. arXiv1308.0714, (111). Retrieved from http://arxiv.org/abs/1308.0714

Iglesias-Freire, Óscar, Bates, J. R., Miyahara, Y., Asenjo, A., & Grütter, Peter H. (2013). Tip-induced artifacts in magnetic force microscopy images. Appl. Phys. Lett., 102(2), 022417. https://doi.org/10.1063/1.4776669

Paul, W., Oliver, D., Miyahara, Y., & Grütter, P. (2013). Transient adhesion and conductance phenomena in initial nanoscale mechanical contacts between dissimilar metals. Nanotechnology, 24(47), 475704. https://doi.org/10.1088/0957-4484/24/47/475704

Tekiel, A., Fostner, S., Topple, J., Miyahara, Y., & Gr\"utter, Peter. (2013). Reactive growth of MgO overlayers on Fe(001) surfaces studied by low-energy electron diffraction and atomic force microscopy. Appl. Surf. Sci., 273, 247--252. https://doi.org/10.1016/j.apsusc.2013.02.024

Tekiel, A., Miyahara, Y., Topple, J. M., & Grutter, P. (2013). Room-Temperature Single-Electron Charging Detected by Electrostatic Force Microscopy. ACS Nano, 7(5), 4683--4690. https://doi.org/10.1021/nn401840n

Tekiel, A., Fostner, S., Topple, J., Miyahara, Y., & Grütter, P. (2013). Reactive growth of MgO overlayers on Fe(001) surfaces studied by low-energy electron diffraction and atomic force microscopy. Applied Surface Science, 273, 247–252. https://doi.org/10.1016/j.apsusc.2013.02.024

Bates, J. R., Miyahara, Y., Burgess, J a J, Iglesias-Freire, \’O, & Gr?tter, P. (2013). Effect of using stencil masks made by focused ion beam milling on permalloy (Ni 81 Fe 19 ) nanostructures. Nanotechnology, 24(11), 115301. https://doi.org/10.1088/0957-4484/24/11/115301

Paul, W., Oliver, D., Miyahara, Y., & Grutter, Peter H. (2013). Minimum Threshold for Incipient Plasticity in the Atomic-Scale Nanoindentation of Au(111). Phys. Rev. Lett., 110(13), 135506. https://doi.org/10.1103/PhysRevLett.110.135506

Paul, W., Miyahara, Y., & Grütter, P. H. (2013). Simple Si(111) surface preparation by thin wafer cleavage. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 31(2), 023201. https://doi.org/10.1116/1.4790475

Iglesias-Freire, Ó., Bates, J. R., Miyahara, Y., Asenjo, A., & Grütter, P. H. (2013). Tip-induced artifacts in magnetic force microscopy images. Applied Physics Letters, 102(2), 022417. https://doi.org/10.1063/1.4776669

Tekiel, A., Topple, J., Miyahara, Y., & Gr\"utter, Peter H. (2012). Layer-by-layer growth of sodium chloride overlayers on an Fe(001)-p(1 × 1)O surface. Nanotechnology, 23(50), 505602. https://doi.org/10.1088/0957-4484/23/50/505602

Miyahara, Y., Cockins, L., & Grütter, P. (2012). Electrostatic Force Microscopy Characterization of Low Dimensional Systems. In Kelvin Probe Force Microscopy (pp. 175–199). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-642-22566-6_9

Tekiel, A., Topple, J., Miyahara, Y., & Grütter, P. (2012). Layer-by-layer growth of sodium chloride overlayers on an Fe(001)-p(1 × 1)O surface. Nanotechnology, 23(50), 505602. https://doi.org/10.1088/0957-4484/23/50/505602

Oliver, D. J., Maassen, J., El Ouali, M., Paul, W., Hagedorn, T., Miyahara, Y., … Grutter, P. (2012). Conductivity of an atomically defined metallic interface. Proceedings of the National Academy of Sciences, 109(47), 19097--19102. https://doi.org/10.1073/pnas.1208699109

Labuda, A., Lysy, M., Paul, W., Miyahara, Y., Grutter, Peter, Bennewitz, R., & Sutton, M. (2012). Stochastic noise in atomic force microscopy. Physical Review E, 86(3), 031104. https://doi.org/10.1103/PhysRevE.86.031104

Paul, W., Miyahara, Y., & Grutter, Peter. (2012). Implementation of atomically defined field ion microscopy tips in scanning probe microscopy. Nanotechnology, 23(33), 335702. https://doi.org/10.1088/0957-4484/23/33/335702

Labuda, A., Kobayashi, K., Miyahara, Y., & Grütter, P. (2012). Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environments. Review of Scientific Instruments, 83(5), 053703. https://doi.org/10.1063/1.4712286

Labuda, A., Kobayashi, K., Miyahara, Y., & Grutter, Peter. (2012). Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environments. Review of Scientific Instruments, 83(5), 053703. https://doi.org/10.1063/1.4712286

Cockins, L., Miyahara, Y., Bennett, S. D., Clerk, A. A., & Grutter, P. (2012). Excited-State Spectroscopy on an Individual Quantum Dot Using Atomic Force Microscopy. Nano Letters, 12(2), 709–713. https://doi.org/10.1021/nl2036222

Fostner, S., Tekiel, A., Topple, J. M., Miyahara, Y., & Grütter, P. (2011). Field deposition from metallic tips onto insulating substrates. Nanotechnology, 22(46), 465301. https://doi.org/10.1088/0957-4484/22/46/465301

Hagedorn, T., Ouali, M. E., Paul, W., Oliver, D., Miyahara, Y., & Grütter, P. (2011). Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope. Review of Scientific Instruments, 82(11), 113903. https://doi.org/10.1063/1.3660279

Labuda, A., Miyahara, Y., Cockins, L., & Grutter, Peter H. (2011). Decoupling conservative and dissipative forces in frequency modulation atomic force microscopy. Physical Review B, 84(12), 125433. https://doi.org/10.1103/PhysRevB.84.125433

Hedberg, J. A., Lal, A., Miyahara, Y., Gr\"utter, P., Gervais, G., Hilke, M., … West, K. W. (2010). Low temperature electrostatic force microscopy of a deep two-dimensional electron gas using a quartz tuning fork. Appl. Phys. Lett., 97(14), 143107. https://doi.org/10.1063/1.3499293

Cockins, L., Miyahara, Y., Bennett, S. D., Clerk, A. A., Studenikin, S., Poole, P., … Grutter, P. (2010). Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy. Proceedings of the National Academy of Sciences, 107(21), 9496–9501. https://doi.org/10.1073/pnas.0912716107

LeDue, J. M., Lopez-Ayon, M., Miyahara, Y., Burke, S. A., & Grütter, P. (2010). Noise in combined optical microscopy and dynamic force spectroscopy: Toward in vivo hydration measurements. J. Vac. Sci. Technol. B, Nanotechnol. Microelectron. Mater. Process. Meas. Phenom., 28(3), C4C15--C4C20. https://doi.org/10.1116/1.3368462

Godin, M., Tabard-Cossa, V., Miyahara, Y., Monga, T., Williams, P. J., Beaulieu, L. Y., … Grutter, P. (2010). Cantilever-based sensing: the origin of surface stress and optimization strategies. Nanotechnology, 21(7), 075501. https://doi.org/10.1088/0957-4484/21/7/075501

Bennett, S. D., Cockins, L., Miyahara, Y., Grutter, Peter, & Clerk, A. A. (2010). Strong Electromechanical Coupling of an Atomic Force Microscope Cantilever to a Quantum Dot. Phys. Rev. Lett., 104(1), 017203. https://doi.org/10.1103/PhysRevLett.104.017203

Burke, S. A., LeDue, J. M., Miyahara, Y., Topple, J. M., Fostner, S., & Grutter, P. (2009). Determination of the local contact potential difference of PTCDA on NaCl: a comparison of techniques. Nanotechnology, 20(26), 264012. https://doi.org/10.1088/0957-4484/20/26/264012

LeDue, J. M., Lopez-Ayon, M., Burke, S. A., Miyahara, Y., & Grutter, P. (2009). High Q optical fiber tips for NC-AFM in liquid. Nanotechnology, 20(26), 264018. https://doi.org/10.1088/0957-4484/20/26/264018

Cockins, L., Miyahara, Y., & Grutter, P. (2009). Spatially resolved low-frequency noise measured by atomic force microscopy. Phys. Rev. B, 79(12), 121309. https://doi.org/10.1103/PhysRevB.79.121309

Cockins, L., Miyahara, Y., Stomp, R., & Grutter, P. (2007). High-aspect ratio metal tips attached to atomic force microscopy cantilevers with controlled angle, length, and radius for electrostatic force microscopy. Review of Scientific Instruments, 78(11), 113706. https://doi.org/10.1063/1.2805513

Mativetsky, J. M., Miyahara, Y., Fostner, S., Burke, S. A., & Grutter, P. (2006). Use of an electron-beam evaporator for the creation of nanostructured pits in an insulating surface. Applied Physics Letters, 88(23), 233121. https://doi.org/10.1063/1.2210288

Pumarol, M. E., Miyahara, Y., Gagnon, R., & Grütter, P. (2005). Controlled deposition of gold nanodots using non-contact atomic force microscopy. Nanotechnology, 16(8), 1083–1088. https://doi.org/10.1088/0957-4484/16/8/015

Sun, Y., Mortensen, H., Schaer, Sacha, Lucier, A.-S., Miyahara, Y., Grutter, Peter, & Hofer, W. (2005). From tunneling to point contact: Correlation between forces and current. Phys. Rev. B, 71(19), 193407. https://doi.org/10.1103/PhysRevB.71.193407

Stomp, R., Miyahara, Y., Schaer, S., Sun, Q., Guo, H., Grutter, P., … Sachrajda, A. (2005). Detection of Single-Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic-Force Microscopy. Phys. Rev. Lett., 94(5), 056802. https://doi.org/10.1103/PhysRevLett.94.056802

Kul’bachinskii, V. A., Ozaki, H., Miyahara, Y., & Funagai, K. (2003). A tunneling spectroscopy study of the temperature dependence of the forbidden band in Bi2Te3 and Sb2Te3. Journal of Experimental and Theoretical Physics, 97(6), 1212--1218. https://doi.org/10.1134/1.1641903

Lal, A., Miyahara, Y., Perez, R., Breguet, J. M., & Bleuler, H. (2002). Application of SPM technology for position sensing in micro-nano robotics. In Third Int. Work. Microfactories (pp. 1--4).

P\’erez, Ricardo, Lal, A., Miyahara, Y., Breguet, J. M., & Bleuler, H. (2002). Modelling, Characterisation and implementation of a monolithic piezo-actuator (MPA) of 2 and 3 degrees of freedom (DOF). In Proc. 8th Int. Conf. new actuator.

Hirota, Y., Ichiyama, K., Hosoi, N., Oikawa, Y., Miyahara, Y., Kulbachinskii, V. A., & Ozaki, H. (2002). Thermoelectric properties of mixed layered compounds TiS\$}2-x{\$/Se\$}x{\$ (0≤×≤2). In Twenty-First Int. Conf. Thermoelectr. 2002. Proc. ICT ’02. (pp. 159--162). IEEE. https://doi.org/10.1109/ICT.2002.1190289

Miyahara, Y., Deschler, M., Fujii, T., Watanabe, S., & Bleuler, H. (2002). Non-contact atomic force microscope with a PZT cantilever used for deflection sensing, direct oscillation and feedback actuation. Appl. Surf. Sci., 188(3–4), 450--455. https://doi.org/10.1016/S0169-4332(01)00929-1

Kazama, A., Bando, H., Miyahara, Y., Enomoto, H., & H, O. (2001). Angle-resolved tunneling spectroscopy of Si conduction band using bonded Si(111) wafer pair. In N. Miura & T. Ando (Eds.), Proc. 25TH Int. Conf. Phys. Semicond. PTS I II (pp. 144--145). Osaka: BERLIN, PRINGER-VERLAG.

Sako, K., Miyahara, Y., Fujii, T., Watanabe, S., Hosaka, H., Bleuler, H., & Itao, K. (2001). Sub nano-meter control by self-sensing and self-actuating probe. Micromechatronics, 45(1), 8--15. Retrieved from http://ci.nii.ac.jp/naid/110002687185/

Bando, H., Koizumi, K., Miyahara, Y., & Ozaki, H. (2000). Scanning tunnelling microscopy study of the charge-density wave in Hf-doped 1T-TaS2. Journal of Physics: Condensed Matter, 12(19), 4353--4363. https://doi.org/10.1088/0953-8984/12/19/306

Miyahara, Y., Fujii, T., Watanabe, S., Tonoli, A., Carabelli, S., Yamada, H., & Bleuler, H. (1999). Lead zirconate titanate cantilever for noncontact atomic force microscopy. Applied Surface Science, 140(3–4), 428--431. https://doi.org/10.1016/S0169-4332(98)00567-4

Miyahara, Y., Fujii, T., Bleuler, H., Bando, H., & Ozaki, H. (1997). Sub-atomic positioning stage for molecular devices using a lattice reference method. In PTB-Bericht, F-30 (pp. 165--171).

Bando, H., Miyahara, Y., Enomoto, H., & Ozaki, H. (1997). Scanning tunneling microscopy investigations of single-q charge density wave state in hafnium-doped tantalum disulfide. Surface Science, 381(2–3), L609--L613. https://doi.org/10.1016/S0039-6028(97)00082-4

Takano, Y., Ogawa, C., Miyahara, Y., Ozaki, H., & Sekizawa, K. (1997). Single crystal growth of (LaO)CuS. Journal of Alloys and Compounds, 249(1–2), 221--223. https://doi.org/10.1016/S0925-8388(96)02536-4

Syoji, T., Miyahara, Y., & Ozaki, H. (1996). Tunneling study of the valence band structure of Pb1-xEuxTe. Japanese Journal of Applied Physics, Part 2: Letters, 35(Part 2, No. 4B), L471--L472. https://doi.org/10.1143/JJAP.35.L471

Funagai, K., Miyahara, Y., Ozaki, H., & Kulbachinskii, V. A. (1996). Tunneling spectroscopy of band edge structures of Bi2Te3 and Sb2Te3. In International Conference on Thermoelectrics, ICT, Proceedings (pp. 408--411).

Miyahara, Y., Bando, H., & Ozaki, H. (1996). Tunnelling spectroscopy investigation of the CDW state in TiSe2-xSx. Journal of Physics: Condensed Matter, 8(40), 7453–7461. https://doi.org/10.1088/0953-8984/8/40/010

Miyahara, Y., Bando, H., Hiramatsu, T., Ozaki, H., & H., E. (1995). Angle Resolved Tunneling Spectroscopy of TiSe2. In Satell. Work. 9th Int. Conf. Solid Surfaces “Tunneling Charact. Individ. Surf. Atoms” (p. 14). Kanazawa, Japan.

Miyahara, Y., Bando, H., & Ozaki, H. (1995). Tunnelling spectroscopic study of the CDW energy gap in TiSe2. Journal of Physics: Condensed Matter, 7(13), 2553–2561. https://doi.org/10.1088/0953-8984/7/13/006