Portrait of Mr. Robert Lowell Wright

Mr. Robert Lowell Wright

  • Assoc Professor of Instruction at Dept of Information Systems & Analytics, McCoy College of Business

Scholarly and Creative Works

2011

  • Wright, R. L. (2011). Simulating conveyor-based amhs layout configurations in small wafer lot manufacturing environments. IEEE. Retrieved from 10.1109/WSC.2011.6147908

2010

  • Wright, R. L. (2010). AMHS factors enabling small wafer lot manufacturing in semiconductor wafer fabs. IEEE. Retrieved from 10.1109/WSC.2010.5678953

2008

  • Wright, R. L. (2008). High speed semiconductor fab simulation for large, medium and small lot sizes.
  • Wright, R. L. (2008). 300 mm Productivity Detractors Mitigation Cost Analysis. IEEE. Retrieved from 10.1109/ASMC.2008.4529042
  • Rothe, O., Van Eck, B., Fandel, D., & Wright, R. L. (2008). A Vision for a Next-Generation 300mm Factory. Solid State Technology, 51(10), 24. Retrieved from https://go.gale.com/ps/anonymous?id=GALE%7CA186951809&sid=googleScholar&v=2.1&it=r&linkaccess=abs&issn=0038111X&p=AONE&sw=w
  • Fandel, D., & Wright, R. L. (2008). 300mmPrime: Tackling detractors of fab productivity. Semiconductor International, 31(8), 51–56. Retrieved from 300mmPrime: Tackling Detractors of Fab Productivity D FANDEL, R WRIGHT - Semiconductor international, 2008 - Cahners
  • Wright, R. L., Zarifoglu, E., Bubela, C., & Preece, J. (2008). Modeling Semiconductor Factories for Equipment and Cycle Time Reduction Opportunities; Part II. Future Fab International, 25, 54–59.
  • Wright, R. L., & Bass, E. (2008). Modeling Semiconductor Factories for Equipment and Cycle Time Reduction. Future Fab International, (24), 50–55.

2005

  • Ghatalia, A., Adusimilli, K., Dyer, D., Worth, W., Wright, R. L., Naughton, P., … Burnett, S. (2005). Impact of Single-Wafer Clean on Manufacturing Efficiency - Semiconductor Fab Perspective. FabTech. Retrieved from www.fabtech.org/lib/printable/576/

2004

  • Wright, R. L. (2004). Comparative factory analysis of standard FOUP capacities. IEEE. Retrieved from 10.1109/WSC.2004.1371551
  • Wright, R. L., Hasenbein, J. J., & Sigireddy, S. (2004). Taking a Queue from Simulation, 36(8), 39–43.

2002

  • Wright, R. L. (2002). Effects of metrology load port buffering in automated 300 mm factories. IEEE.

2000

1999